Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction
Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction
Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction
Yalcin, S. (Autor:in) / Avci, R. (Autor:in)
APPLIED SURFACE SCIENCE ; 214 ; 319-337
01.01.2003
19 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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