Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

    New search for: Yalcin, S.
    New search for: Avci, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

    New search for: Yalcin, S.
    New search for: Avci, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

    New search for: Yalcin, S.
    New search for: Avci, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of PdAu thin films on oxidized silicon wafers: interdiffusion and reaction

    Contributors:

    Yalcin, S. (author) / Avci, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 214 ; 319-337

    Publication date:

    2003-01-01

    Size:

    19 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Physisorption of krypton on thermally oxidized silicon wafers

    Bohra, J. N. / John, P. T. / Saxena, R. K. | British Library Online Contents | 1993

    Ultra thin silicon films directly bonded onto silicon wafers

    Fournel, F. / Moriceau, H. / Magnea, N. et al. | British Library Online Contents | 2000

    Structural characterization of ultra-thin (001) silicon films bonded onto (001) silicon wafers

    Rousseau, K. / Rouviere, J. L. / Fournel, F. et al. | British Library Online Contents | 2001

    Deformation mechanisms of Al films on oxidized Si wafers

    Volkert, C. A. / Alofs, C. F. / Liefting, J. R. | British Library Online Contents | 1994

    Generalized Darken Model: Chemical Interdiffusion in Oxides and Oxidized Multicomponent Alloys

    Danielewski, M. / Filipek, R. / Milewska, A. et al. | British Library Conference Proceedings | 2000

    Back to top