Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Nanometer-Scale Observation of Electrochromic Films using Current-sensing Scanning Near-Field Optical Microscopy
Iwata, F. (Autor:in)
JOURNAL- IMAGING SOCIETY OF JAPAN ; 42 ; 154-159
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
671.367
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