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Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers
Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers
Orientation-Dependent Defect Formation in Silicon Carbide Epitaxial Layers
Yakimova, R. (Autor:in) / Syvajarvi, M. (Autor:in) / Iakimov, T. (Autor:in) / Okunev, A. O. (Autor:in) / Udal tsov, V. E. (Autor:in) / Janzen, E. (Autor:in) / Bergman, P. / Janzen, E.
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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