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Measurement of nitrogen in Czochralski silicon by means of infrared spectroscopy
Measurement of nitrogen in Czochralski silicon by means of infrared spectroscopy
Measurement of nitrogen in Czochralski silicon by means of infrared spectroscopy
Porrini, M. (Autor:in) / Pretto, M. G. (Autor:in) / Scala, R. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 228-232
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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