Correlation between Carrier Recombination Lifetime and Forward Voltage Drop in 4H-SiC PiN Diodes

Chung, G.Y. / Loboda, M.J. / Sundaresan, S.G. et al. | British Library Online Contents | 2010

Extraction of the carrier generation and recombination lifetime from the forward characteristics of advanced diodes

Poyai, A. / Simoen, E. / Claeys, C. et al. | British Library Online Contents | 2003

Forward-Bias Degradation in 4H-SiC p^+nn^+ Diodes: Influence of the Mesa Etching

Camara, N. / Thuaire, A. / Bano, E. et al. | British Library Online Contents | 2005

Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Udal, A. / Velmre, E. | British Library Online Contents | 2007

Absence of Dislocation Motion in 3C-SiC pn Diodes under Forward Bias

Speer, K. M. / Spry, D. J. / Trunek, A. J. et al. | British Library Online Contents | 2007