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Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Brison, J. (Autor:in) / Conard, T. (Autor:in) / Vandervorst, W. (Autor:in) / Houssiau, L. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 749-753
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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