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Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M^+, MCs^+, and M~2Cs~2^+ yields
Brison, J. (author) / Conard, T. (author) / Vandervorst, W. (author) / Houssiau, L. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 749-753
2004-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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