Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the Cameca IMS WF instrument
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the Cameca IMS WF instrument
Accurate on-line depth calibration with a laser interferometer during SIMS profiling on the Cameca IMS WF instrument
Merkulov, A. (Autor:in) / Merkulova, O. (Autor:in) / de Chambost, E. (Autor:in) / Schuhmacher, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 954-958
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2004
|CAMECA IMS 7f-GEO: Specialized SIMS tool for geosciences
British Library Online Contents | 2008
|Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS
British Library Online Contents | 2003
|SIMS analysis of residual gas elements with a Cameca IMS-6f ion microprobe
British Library Online Contents | 2006
|Accurate depth profiling for ultra-shallow implants using backside-SIMS
British Library Online Contents | 2004
|