Nature of the interface of (100)Ge/insulator structures with ultrathin HfO2 and GeOx(Ny) layers probed by electron spin resonance

Stesmans, A. / Afanas'ev, V. V. | British Library Online Contents | 2005

Incorporation effect of Y2O3 on the structure and optical properties of HfO2 thin films

Chen, X. / Song, L. / You, L. et al. | British Library Online Contents | 2013

Study of HfO2 thin films prepared by electron beam evaporation

Wang, Y. / Lin, Z. / Cheng, X. et al. | British Library Online Contents | 2004

Enhanced tunneling in stacked gate dielectrics with ultra-thin HfO2 layers sandwiched between thicker SiO2 layers

Hinkle, C. L. / Fulton, C. / Nemanich, R. J. et al. | British Library Online Contents | 2004

Solid phase crystallisation of HfO2 thin films

Modreanu, M. / Sancho-Parramon, J. / O'Connell, D. et al. | British Library Online Contents | 2005