Simultaneous optical measurement of Germanium content and Boron doping in strained heteroepitaxial SiGe films using a novel data-analysis technique

Morris, S. J. / Fougeres, P. / Bozzo-Escoubas, S. et al. | British Library Online Contents | 2004

Simultaneous optical measurement of Ge-content and carbon doping in strained epitaxial SiGe films

Morris, S. / Le Cunff, D. / Ristoiu, D. et al. | British Library Online Contents | 2006

High resolution boron content profilometry at δ-doping epitaxial diamond interfaces by CTEM

Piñero, J.C. / Lloret, F. / Alegre, M.P. et al. | British Library Online Contents | 2018

Critical Thickness of Epitaxial Grown Semiconductor Films with Strained Structure

Li, J.C. / Li, M. / Jiang, Q. | British Library Online Contents | 2008

Defects in Strained Epitaxial SrRuO~3 Films on SrTiO~3 Substrates

Oh, S. H. / Suh, J. H. / Park, C. G. | British Library Online Contents | 2007