Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films: Fid-Bau Portal

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

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Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

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Titel:

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Beteiligte:

Losee, P. A. (Autor:in) / Li, C. (Autor:in) / Seiler, J. (Autor:in) / Stahlbush, R. E. (Autor:in) / Chow, T. P. (Autor:in) / Bhat, I. B. (Autor:in) / Gutmann, R. J. (Autor:in) / Nipoti, R. / Poggi, A. / Scorzoni, A.

Erschienen in:

Silicon Carbide and Related Materials 2004 ; 961-964

MATERIALS SCIENCE FORUM ; 483/485

Erscheinungsdatum:

01.01.2005

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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