Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films: Fid-Bau Portal

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

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Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Losee, P. A. / Li, C. / Seiler, J. / Stahlbush, R. E. / Chow, T. P. / Bhat, I. B. / Gutmann, R. J.

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Title:

Electrical Characteristics and Reliability of 4H-SiC PiN Diodes Fabricated on In-House Grown and Commercial Epitaxial Films

Contributors:

Losee, P. A. (author) / Li, C. (author) / Seiler, J. (author) / Stahlbush, R. E. (author) / Chow, T. P. (author) / Bhat, I. B. (author) / Gutmann, R. J. (author) / Nipoti, R. / Poggi, A. / Scorzoni, A.

Published in:

Silicon Carbide and Related Materials 2004 ; 961-964

MATERIALS SCIENCE FORUM ; 483/485

Publication date:

2005-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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