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High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques
High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques
High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques
Lioutas, C. B. (Autor:in) / Frangis, N. (Autor:in) / Soumelidis, S. (Autor:in) / Chiussi, S. (Autor:in) / Lopez, E. (Autor:in) / Leon, B. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 4527-4530
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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