High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques: Fid-Bau Portal

High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques

Lioutas, C. B. / Frangis, N. / Soumelidis, S. / Chiussi, S. / Lopez, E. / Leon, B.

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High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques

Lioutas, C. B. / Frangis, N. / Soumelidis, S. / Chiussi, S. / Lopez, E. / Leon, B.

High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques

Lioutas, C. B. / Frangis, N. / Soumelidis, S. / Chiussi, S. / Lopez, E. / Leon, B.

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Check availability in my library

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Document information

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Document information

Title:

High-resolution electron microscopy study of SiGeC thin films grown on Si(100) by laser-assisted techniques

Contributors:

Lioutas, C. B. (author) / Frangis, N. (author) / Soumelidis, S. (author) / Chiussi, S. (author) / Lopez, E. (author) / Leon, B. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 4527-4530

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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