Excess Carrier Lifetime Mapping for Bulk SiC Wafers by Microwave Photoconductivity Decay Method and Its Relationship with Structural Defect Distribution

Kato, M. / Ichimura, M. / Arai, E. et al. | British Library Online Contents | 2004

Recombination Lifetime in Silicon from Laser Microwave Photoconductance Decay Measurement

Ling, C. H. / Teoh, H. K. / Choi, W. K. et al. | British Library Online Contents | 1995

Measurements of Polishing-Induced Residual Damages in Silicon Wafers Using Noncontact Photoconductivity Amplitude Technique

Ogita, Y. / Nakano, M. / Masumura, H. | British Library Online Contents | 1995

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003