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Quantitative fundamental SIMS studies using 18O implant standards
Quantitative fundamental SIMS studies using 18O implant standards
Quantitative fundamental SIMS studies using 18O implant standards
Williams, P. (Autor:in) / Sobers, R. C. (Autor:in) / Franzreb, K. (Autor:in) / Lorincik, J. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 6429-6432
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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