Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Quantitative fundamental SIMS studies using 18O implant standards

    New search for: Williams, P.
    New search for: Sobers, R. C.
    New search for: Franzreb, K.
    New search for: Lorincik, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Quantitative fundamental SIMS studies using 18O implant standards

    New search for: Williams, P.
    New search for: Sobers, R. C.
    New search for: Franzreb, K.
    New search for: Lorincik, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Quantitative fundamental SIMS studies using 18O implant standards

    New search for: Williams, P.
    New search for: Sobers, R. C.
    New search for: Franzreb, K.
    New search for: Lorincik, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Quantitative fundamental SIMS studies using 18O implant standards

    Contributors:

    Williams, P. (author) / Sobers, R. C. (author) / Franzreb, K. (author) / Lorincik, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 6429-6432

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Metal implant standards for surface analysis by TOF-SIMS and dynamic SIMS: comparison with TRIM simulation

    Li-Fatou, A. V. / Douglas, M. | British Library Online Contents | 2003

    New and Improved Quantitative Characterization of SiC Using SIMS

    Wang, L. / Sams, D. B. / Wang, A. et al. | British Library Online Contents | 2002

    D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides

    Bersani, M. / Giubertoni, D. / Barozzi, M. et al. | British Library Online Contents | 2003

    Towards quantitative chemical imaging with ToF-SIMS

    Wagner, M. S. | British Library Online Contents | 2008

    Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS

    Min, H. / Jung, G. / Moon, D. W. et al. | British Library Online Contents | 2008

    Back to top