Electromigration in ULSI interconnects

Tan, C. M. / Roy, A. | British Library Online Contents | 2007

Electromigration and IC Interconnects

Thompson, C. V. / Lloyd, J. R. | British Library Online Contents | 1993

Challenges of electromigration - Electromigration degradation mechanisms in copper dual-inlaid interconnects -

Zschech, E. / Meyer, M. A. / Grafe, M. et al. | British Library Online Contents | 2004

Growth of electromigration-induced hillocks in Al interconnects

Nucci, J. A. / Straub, A. / Bischoff, E. et al. | British Library Online Contents | 2002

Damage mechanics of electromigration in microelectronics copper interconnects

Basaran, Cemal / Lin, Minghui | British Library Online Contents | 2007