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C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips
C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips
C-AFM-based thickness determination of thin and ultra-thin SiO2 films by use of different conductive-coated probe tips
Frammelsberger, W. (Autor:in) / Benstetter, G. (Autor:in) / Kiely, J. (Autor:in) / Stamp, R. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 3615-3626
01.01.2007
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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