Influence of Epilayer Thickness and Structural Defects on the Minority Carrier Lifetime in 4H-SiC

Kallinger, B. / Berwian, P. / Friedrich, J. et al. | British Library Online Contents | 2013

Impact of 4H-SiC Substrate Defectivity on Epilayer Injected Carrier Lifetimes

Ward, R.L.M. / Lew, K.K. / Van Mil, B.L. et al. | British Library Online Contents | 2009

Thick Epilayer for Power Devices

Henry, A. / Hassan, J. / Pedersen, H. et al. | British Library Online Contents | 2007

Determination of Ambipolar Lifetime and Epilayer Thickness of 5kV SiC Bipolar Devices by Transient Switching Studies

Salah, T.B. / Risaletto, S. / Raynaud, C. et al. | British Library Online Contents | 2009

Lifetime Control of the Minority Carrier in PiN Diodes by He^+ Ion Implantation

Tanaka, Y. / Kojima, K. / Takao, K. et al. | British Library Online Contents | 2005