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A novel stylus profiler without nonlinearity and parasitic motion for FPD inspection system
A novel stylus profiler without nonlinearity and parasitic motion for FPD inspection system
A novel stylus profiler without nonlinearity and parasitic motion for FPD inspection system
Jung, H.S. (Autor:in) / Hong, M.-S. (Autor:in) / Lee, S.-H. (Autor:in) / Park, J.H. (Autor:in) / Kang, D.W. (Autor:in) / Lee, M.G. (Autor:in)
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY ; 21 ; 1491-1497
01.01.2007
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621
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British Library Online Contents | 1995
|Measurement and characterization of a nano-scale multiple-step height sample using a stylus profiler
British Library Online Contents | 2016
|Measurement and characterization of a nano-scale multiple-step height sample using a stylus profiler
British Library Online Contents | 2016
|Measurement and characterization of a nano-scale multiple-step height sample using a stylus profiler
British Library Online Contents | 2016
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