Electrical properties of NiFe2O4 epitaxial ultra-thin films

Boni, G. A. / Hrib, L. / Porter, S. B. et al. | British Library Online Contents | 2017

Improvement of C-V Characteristics and Control of Interlayer Growth of Rare Earth Oxide Stabilized Zirconia Epitaxial Gate Dielectrics

Kiguchi, T. / Wakiya, N. / Shinozaki, K. et al. | British Library Online Contents | 2003

Depth profiling of ultra-thin oxynitride gate dielectrics by using MCs2+ technique

Gui, D. / Mo, Z. Q. / Xing, Z. X. et al. | British Library Online Contents | 2008

Investigation of Ultra Thin Thermal Nitrided Gate Dielectrics in Comparison to Plasma Nitrided Gate Dielectrics for High-Performance Logic Application for 65nm

Trentzsch, M. / Golz, C. / Wieczorek, K. et al. | British Library Online Contents | 2008

The electrical properties of MIS capacitors with ALN gate dielectrics

Adam, T. / Kolodzey, J. / Swann, C. P. et al. | British Library Online Contents | 2001