Identification of Defects Limiting the Carrier Lifetime in n^- Epitaxial Layers of 4H-SiC

Klein, P.B. | British Library Online Contents | 2010

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. et al. | British Library Online Contents | 2009

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Maximenko, S.I. / Freitas, J.A. / Picard, Y.N. et al. | British Library Online Contents | 2010

High-Resolution Time-Resolved Carrier Lifetime and Photoluminescence Mapping of 4H-SiC Epilayers

Booker, I.D. / Hassan, J. / Janzen, E. et al. | British Library Online Contents | 2012

The Effect of Growth Conditions on Carrier Lifetime in n-Type 4H-SiC Epitaxial Layers

Lilja, L. / Hassan, J. / Booker, I.D. et al. | British Library Online Contents | 2012