Sodium Enhanced Oxidation of Si-Face 4H-SiC: A Method to Remove Near Interface Traps

Sveinbjornsson, E. O. / Allerstam, F. / Olafsson, H. O. et al. | British Library Online Contents | 2007

Effect of interface traps on Debye thickness semiconductor films

Sandomirsky, V. / Butenko, A. V. / Kolobov, I. G. et al. | British Library Online Contents | 2006

An Approach to Model Temperature Effects of Interface Traps in 4H-SiC

Rao, R. / Balaji, S. / Matocha, K. et al. | British Library Online Contents | 2007

Simulation study of interface traps and bulk traps in n^+^+GaN/InAlN/AlN/GaN high electron mobility transistors

Molnar, M. / Donoval, D. / Kuzmik, J. et al. | British Library Online Contents | 2014

Verification of Near-Interface Traps Models by Electrical Measurements on 4H-SiC n-Channel Mosfets

Uhnevionak, V. / Strenger, C. / Burenkov, A. et al. | British Library Online Contents | 2013