Micronic n-channel MOSFET degradation under strong and short-time hot-carrier stress

Djahli, F. / Plossu, C. / Balland, B. | British Library Online Contents | 1992

MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown

Gerardin, S. / Cester, A. / Paccagnella, A. et al. | British Library Online Contents | 2004

Operation of SiGe channel heterojunction p-MOSFET

Dollfus, P. / Musalem, F.-X. / Galdin, S. et al. | British Library Online Contents | 1996

A P-Channel MOSFET on 4H-SiC

Han, J. S. / Cheong, K. Y. / Dimitrijev, S. et al. | British Library Online Contents | 2004

Effect of Process Variations on 4H Silicon Carbide n-Channel MOSFET Mobilities

Lu, C.-Y. / Cooper, J. A. / Chung, G. Y. et al. | British Library Online Contents | 2002