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Structural Characterization of GaN Epitaxial Layers Grown on 4H-SiC Substrates with Different Off-Cut
Structural Characterization of GaN Epitaxial Layers Grown on 4H-SiC Substrates with Different Off-Cut
Structural Characterization of GaN Epitaxial Layers Grown on 4H-SiC Substrates with Different Off-Cut
Caban, P. (Autor:in) / Kosciewicz, K. (Autor:in) / Strupinski, W. (Autor:in) / Szmidt, J. (Autor:in) / Pagowska, K. (Autor:in) / Ratajczak, R. (Autor:in) / Wojcik, M. (Autor:in) / Gaca, J. (Autor:in) / Turos, A. (Autor:in)
MATERIALS SCIENCE FORUM ; 615/617 ; 939-942
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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