Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Recovery of Bipolar-Current Induced Degradations in High-Voltage Implanted-Gate Junction Field Effect Transistors
Recovery of Bipolar-Current Induced Degradations in High-Voltage Implanted-Gate Junction Field Effect Transistors
Recovery of Bipolar-Current Induced Degradations in High-Voltage Implanted-Gate Junction Field Effect Transistors
Veliadis, V. (Autor:in) / Hearne, H. (Autor:in) / Chang, W. (Autor:in) / Caldwell, J.D. (Autor:in) / Stewart, E.J. (Autor:in) / Snook, M. (Autor:in) / Howell, R.S. (Autor:in) / Urciuoli, D. (Autor:in) / Lelis, A.J. (Autor:in) / Scozzie, C. (Autor:in)
MATERIALS SCIENCE FORUM ; 717/720 ; 1013-1016
01.01.2012
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2009
|Performance Assessment of 4H-SiC Bipolar Junction Transistors and Insulated Gate Bipolar Transistors
British Library Online Contents | 2006
|Improvement and Analysis of Implanted-Emitter Bipolar Junction Transistors in 4H-SiC
British Library Online Contents | 2002
|Surface Passivation of 4H-SiC for High Current Gain Bipolar Junction Transistors
British Library Online Contents | 2009
|4H-SiC Bipolar Junction Transistors with a Current Gain of 108
British Library Online Contents | 2009
|