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Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures
Domanowska, A. (Autor:in) / Miczek, M. (Autor:in) / Ucka, R. (Autor:in) / Matys, M. (Autor:in) / Adamowicz, B. (Autor:in) / Zywicki, J. (Autor:in) / Taube, A. (Autor:in) / Korwin-Mikke, K. (Autor:in) / Gieraltowska, S. (Autor:in) / Sochacki, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 258 ; 8354-8359
01.01.2012
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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