Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures: Fid-Bau Portal

Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

Domanowska, A. / Miczek, M. / Ucka, R. / Matys, M. / Adamowicz, B. / Zywicki, J. / Taube, A. / Korwin-Mikke, K. / Gieraltowska, S. / Sochacki, M.

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Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

Domanowska, A. / Miczek, M. / Ucka, R. / Matys, M. / Adamowicz, B. / Zywicki, J. / Taube, A. / Korwin-Mikke, K. / Gieraltowska, S. / Sochacki, M.

Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

Domanowska, A. / Miczek, M. / Ucka, R. / Matys, M. / Adamowicz, B. / Zywicki, J. / Taube, A. / Korwin-Mikke, K. / Gieraltowska, S. / Sochacki, M.

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Title:

Surface photovoltage and Auger electron spectromicroscopy studies of HfO2/SiO2/4H-SiC and HfO2/Al2O3/4H-SiC structures

Contributors:

Domanowska, A. (author) / Miczek, M. (author) / Ucka, R. (author) / Matys, M. (author) / Adamowicz, B. (author) / Zywicki, J. (author) / Taube, A. (author) / Korwin-Mikke, K. (author) / Gieraltowska, S. (author) / Sochacki, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 258 ; 8354-8359

Publication date:

2012-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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