Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing: Fid-Bau Portal

Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing

Yao, Y.Z. / Sato, K. / Sugawara, Y. / Ishikawa, Y. / Okamoto, Y. / Hayashi, N.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing

Yao, Y.Z. / Sato, K. / Sugawara, Y. / Ishikawa, Y. / Okamoto, Y. / Hayashi, N.

Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing

Yao, Y.Z. / Sato, K. / Sugawara, Y. / Ishikawa, Y. / Okamoto, Y. / Hayashi, N.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Electron Beam Induced Current Observation of Dislocations in 4H-SiC Introduced by Mechanical Polishing

Beteiligte:

Yao, Y.Z. (Autor:in) / Sato, K. (Autor:in) / Sugawara, Y. (Autor:in) / Ishikawa, Y. (Autor:in) / Okamoto, Y. (Autor:in) / Hayashi, N. (Autor:in) / Yamada-Kaneta, H. / Sakai, A.

Erschienen in:

Defects-Recognition, Imaging and Physics in Semiconductors XIV ; 23-26

MATERIALS SCIENCE FORUM ; 725

Erscheinungsdatum:

01.01.2012

Format / Umfang:

4 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Matsuhata, H. / Yamaguchi, H. / Nagai, I. et al. | British Library Online Contents | 2009

Microstructural Analysis of Damaged Layer Introduced during Chemo-Mechanical Polishing

Sako, H. / Yamashita, T. / Tamura, K. et al. | British Library Online Contents | 2014

Electron microscope study of dislocations introduced by deformation in a Si between 77 and 873 K

Okuno, T. / Saka, H. | British Library Online Contents | 2013

Bridge Beam Series Introduced

Copelan, Craig | Online Contents | 2010

High-voltage electron-microscopical observation of crack-tip dislocations in silicon crystals

Tanaka, M. / Higashida, K. | British Library Online Contents | 2005

Nach oben