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A Study on Surface Roughness of Curved Silicon Crystal Spectrometer Fabricated by Plasma Chemical Vaporization Machining
A Study on Surface Roughness of Curved Silicon Crystal Spectrometer Fabricated by Plasma Chemical Vaporization Machining
A Study on Surface Roughness of Curved Silicon Crystal Spectrometer Fabricated by Plasma Chemical Vaporization Machining
Yamamoto, Y. (Autor:in) / Hosoda, M. (Autor:in) / Nagano, M. (Autor:in) / Yamamura, K. (Autor:in)
KEY ENGINEERING MATERIALS ; 516 ; 522-526
01.01.2012
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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