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Pattern Transfer of 23-Nm-Diameter Block Copolymer Self-Assembled Nanodots Using CF~4 Etching with Carbon Hard Mask (CHM) as Mask
Pattern Transfer of 23-Nm-Diameter Block Copolymer Self-Assembled Nanodots Using CF~4 Etching with Carbon Hard Mask (CHM) as Mask
Pattern Transfer of 23-Nm-Diameter Block Copolymer Self-Assembled Nanodots Using CF~4 Etching with Carbon Hard Mask (CHM) as Mask
Huda, M. (Autor:in) / Liu, J. (Autor:in) / Mohamad, Z.B. (Autor:in) / Yin, Y. (Autor:in) / Hosaka, S. (Autor:in) / Abdullah, M. / Okuyama, K. / Khairurrijal
01.01.2013
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Improved Observation Contrast of Block-Copolymer Nanodot Pattern Using Carbon Hard Mask (CHM)
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