Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Piezoresistivity and Electrical Conductivity of SiC Thin Films Deposited by High Temperature PECVD
Piezoresistivity and Electrical Conductivity of SiC Thin Films Deposited by High Temperature PECVD
Piezoresistivity and Electrical Conductivity of SiC Thin Films Deposited by High Temperature PECVD
Jakovlev, O. (Autor:in) / Fuchs, T. (Autor:in) / Rohlfing, F. (Autor:in) / Seidel, H. (Autor:in) / Lebedev, A.A. / Davydov, S.Y. / Ivanov, P.A. / Levinshtein, M.E.
01.01.2013
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Optical properties of boron nitride thin films deposited by microwave PECVD
British Library Online Contents | 2001
|Piezoresistivity of boron doped CVD diamond films
British Library Online Contents | 1997
|Structural analysis of silicon oxynitride films deposited by PECVD
British Library Online Contents | 2004
|Characteristics of PECVD GaN thin films
British Library Online Contents | 1996
|CW laser induced crystallization of thin amorphous silicon films deposited by EBE and PECVD
British Library Online Contents | 2012
|