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Correlation between microstructure evolution and mechanical strength in the Sn–3.0Ag–0.5Cu/ENEPIG solder joint
Correlation between microstructure evolution and mechanical strength in the Sn–3.0Ag–0.5Cu/ENEPIG solder joint
Correlation between microstructure evolution and mechanical strength in the Sn–3.0Ag–0.5Cu/ENEPIG solder joint
Tseng, C. F. (Autor:in) / Duh, J. G. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 580 ; 169-174
01.01.2013
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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