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Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy
Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy
Transit Phenomena in Organic Field-Effect Transistors Through Kelvin-Probe Force Microscopy
Melzer, C. (Autor:in) / Siol, C. (Autor:in) / von Seggern, H. (Autor:in)
ADVANCED MATERIALS -DEERFIELD BEACH THEN WEINHEIM- ; 25 ; 4315-4319
01.01.2013
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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