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Amplitude or frequency modulation-detection in Kelvin probe force microscopy
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
Amplitude or frequency modulation-detection in Kelvin probe force microscopy
Glatzel, T. (Autor:in) / Sadewasser, S. (Autor:in) / Lux-Steiner, M. C. (Autor:in)
APPLIED SURFACE SCIENCE ; 210 ; 84-89
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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