Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Demonstration of High Quality 4H-SiC Epitaxy by Using the Two-Step Growth Method
Demonstration of High Quality 4H-SiC Epitaxy by Using the Two-Step Growth Method
Demonstration of High Quality 4H-SiC Epitaxy by Using the Two-Step Growth Method
Mitani, Y. (Autor:in) / Tomita, N. (Autor:in) / Hamano, K. (Autor:in) / Tarutani, M. (Autor:in) / Tanaka, T. (Autor:in) / Ohno, A. (Autor:in) / Kuroiwa, T. (Autor:in) / Toyoda, Y. (Autor:in) / Imaizumi, M. (Autor:in) / Sumitani, H. (Autor:in)
01.01.2014
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Growth of Device Quality 4H-SiC High Velocity Epitaxy
British Library Online Contents | 2004
|Energy barrier for the growth transition step-flow/step-bunching during epitaxy of InP/InP
British Library Online Contents | 2000
|British Library Online Contents | 1999
|Epitaxy of High Quality SiC Layers by CST
British Library Online Contents | 1998
|High Growth Rate of -SIC by Sublimation Epitaxy
British Library Online Contents | 1998
|