Temperature-Dependence of SiC MOSFET Threshold-Voltage Instability

Lelis, A.J. / Habersat, D.B. / Green, R. et al. | British Library Online Contents | 2009

Temperature-Dependence of SiC MOSFET Threshold-Voltage Instability

Lelis, A.J. / Habersat, D.B. / Green, R. et al. | British Library Online Contents | 2009

3C-SiC MOSFET with High Channel Mobility and CVD Gate Oxide

Kobayashi, M. / Uchida, H. / Minami, A. et al. | British Library Online Contents | 2011

Gate Oxide with High Dielectric Breakdown Strength after Undergoing a Typical Power MOSFET Fabrication Process

Tanimoto, S. / Kiritani, N. / Hoshi, M. et al. | British Library Online Contents | 2003

Oxidation Process by RTP for 4H-SiC MOSFET Gate Fabrication

Constant, A. / Camara, N. / Montserrat, J. et al. | British Library Online Contents | 2011