Oxidation Process by RTP for 4H-SiC MOSFET Gate Fabrication

Constant, A. / Camara, N. / Montserrat, J. et al. | British Library Online Contents | 2011

First AlGaN/GaN MOSFET with photoanodic gate dielectric

Mistele, D. / Rotter, T. / Rover, K. S. et al. | British Library Online Contents | 2002

MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown

Gerardin, S. / Cester, A. / Paccagnella, A. et al. | British Library Online Contents | 2004

3C-SiC MOSFET with High Channel Mobility and CVD Gate Oxide

Kobayashi, M. / Uchida, H. / Minami, A. et al. | British Library Online Contents | 2011

Novel Gate Oxide Process for Realization of High Threshold Voltage in 4H-SiC MOSFET

Furuhashi, M. / Tanioka, T. / Imaizumi, M. et al. | British Library Online Contents | 2014