TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. et al. | British Library Online Contents | 2003

Ultra Shallow Depth Profiling with SIMS

Ehrke, H.-U. | British Library Online Contents | 2008

Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS

Hongo, C. / Tomita, M. / Takenaka, M. et al. | British Library Online Contents | 2003

SIMS depth profiling of working environment nanoparticles

Konarski, P. / Iwanejko, I. / Mierzejewska, A. | British Library Online Contents | 2003

Temperature-controlled depth profiling in polymeric materials using cluster secondary ion mass spectrometry (SIMS)

Mahoney, C. M. / Fahey, A. J. / Gillen, G. et al. | British Library Online Contents | 2006