Spectroscopic ellipsometry characterization of amorphous and crystalline TiO"2 thin films grown by atomic layer deposition at different temperatures

Saha, D. / Ajimsha, R. S. / Rajiv, K. et al. | British Library Online Contents | 2014

Characterization of amorphous organic thin films, determination of precise model for spectroscopic ellipsometry measurements

Farahzadi, A. / Beigmohamadi, M. / Niyamakom, P. et al. | British Library Online Contents | 2010

Phase transformations in hafnium dioxide thin films grown by atomic layer deposition at high temperatures

Aarik, J. / Aidla, A. / Mandar, H. et al. | British Library Online Contents | 2001

Spectroscopic ellipsometry studies of amorphous PZT thin films with various Zr/Ti stoichiometries

Yang, S. / Mo, D. / Tang, X. | British Library Online Contents | 2002

Characterizations of NbAlO thin films grown by atomic layer deposition

Liu, J. / Xu, Y. / Sun, Q. et al. | British Library Online Contents | 2011