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Loss of implanted heavy elements during annealing of ultra-shallow ion-implanted silicon: The complete picture
Loss of implanted heavy elements during annealing of ultra-shallow ion-implanted silicon: The complete picture
Loss of implanted heavy elements during annealing of ultra-shallow ion-implanted silicon: The complete picture
Chan, T.K. (Autor:in) / Koh, S.Y. (Autor:in) / Fang, V. (Autor:in) / Markwitz, A. (Autor:in) / Osipowicz, T. (Autor:in)
Applied surface science ; 314 ; 322-330
01.01.2014
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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