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Residual Stress in Thin Films of Aluminum/Hafnium

Rant, S. J. / Goldsmith, C. C. / Noyan, I. C.

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Residual Stress in Thin Films of Aluminum/Hafnium

Rant, S. J. / Goldsmith, C. C. / Noyan, I. C.

Residual Stress in Thin Films of Aluminum/Hafnium

Rant, S. J. / Goldsmith, C. C. / Noyan, I. C.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Residual Stress in Thin Films of Aluminum/Hafnium

Contributors:

Rant, S. J. (author) / Goldsmith, C. C. (author) / Noyan, I. C. (author)

Published in:

ADVANCES IN X RAY ANALYSIS ; 157

Publication date:

1994-01-01

Size:

157 pages

ISSN:

0376-0308

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 539.7222

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