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Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy
Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy
Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy
Kennou, S. (author) / Ladas, S. (author) / Paloura, E. C. (author) / Kalomiros, J. A. (author)
APPLIED SURFACE SCIENCE ; 90 ; 283
1995-01-01
283 pages
Article (Journal)
Unknown
DDC:
621.35
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