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    Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

    New search for: Kennou, S.
    New search for: Ladas, S.
    New search for: Paloura, E. C.
    New search for: Kalomiros, J. A.

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    Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

    New search for: Kennou, S.
    New search for: Ladas, S.
    New search for: Paloura, E. C.
    New search for: Kalomiros, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

    New search for: Kennou, S.
    New search for: Ladas, S.
    New search for: Paloura, E. C.
    New search for: Kalomiros, J. A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
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    Document information
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    Document information
    Title:

    Characterization of ex-situ hydrogenated amorphous SiC thin films by X-ray photoelectron spectroscopy

    Contributors:

    Kennou, S. (author) / Ladas, S. (author) / Paloura, E. C. (author) / Kalomiros, J. A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 90 ; 283

    Publication date:

    1995-01-01

    Size:

    283 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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