A platform for research: civil engineering, architecture and urbanism
Characterization of Ni/Ge/Au/Ni/Au contact metallization on AlGaAs/InGaAs heterostructures for pseudomorphic heterojunction field effect transistor application
Characterization of Ni/Ge/Au/Ni/Au contact metallization on AlGaAs/InGaAs heterostructures for pseudomorphic heterojunction field effect transistor application
Characterization of Ni/Ge/Au/Ni/Au contact metallization on AlGaAs/InGaAs heterostructures for pseudomorphic heterojunction field effect transistor application
Lee, H. J. (author) / Tse, M. S. (author) / Radhakrishnan, K. (author) / Prasad, K. (author) / Weng, J. (author) / Yoon, S. F. (author) / Tan, H. S. (author) / Zhou, X. (author) / Henini, M. / Szweda, R.
1995-01-01
11 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 1999
|British Library Online Contents | 1995
|Investigation of MBE grown GaAs/AlGaAs/InGaAs heterostructures
British Library Online Contents | 2001
|British Library Online Contents | 1999
|British Library Online Contents | 1997
|