Defect Production and Annealing in Degenerate Silicon Irradiated with Fast Electrons at Low Temperatures: Fid-Bau Portal

Defect Production and Annealing in Degenerate Silicon Irradiated with Fast Electrons at Low Temperatures

Ehrhart, P. / Emtsev, V. V. / Poloskin, D. S. / Zillgen, H.

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Defect Production and Annealing in Degenerate Silicon Irradiated with Fast Electrons at Low Temperatures

Ehrhart, P. / Emtsev, V. V. / Poloskin, D. S. / Zillgen, H.

Defect Production and Annealing in Degenerate Silicon Irradiated with Fast Electrons at Low Temperatures

Ehrhart, P. / Emtsev, V. V. / Poloskin, D. S. / Zillgen, H.

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Check availability in my library

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Document information

Title:

Defect Production and Annealing in Degenerate Silicon Irradiated with Fast Electrons at Low Temperatures

Contributors:

Ehrhart, P. (author) / Emtsev, V. V. (author) / Poloskin, D. S. (author) / Zillgen, H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 151-156

Publication date:

1995-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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