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Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers
Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers
Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers
Kirscht, F. G. (author) / Furukawa, Y. (author) / Seifert, W. (author) / Schmalz, K. (author) / Buczkowski, A. (author) / Kim, S. B. (author) / Abe, H. (author) / Koya, H. (author) / Bailey, J. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 36 ; 230-236
1996-01-01
7 pages
Article (Journal)
English
DDC:
620.11
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