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SIMS characterization of noble metal-based thin film electrodes

Piccirillo, C. / Daolio, S. / Gelosi, S. / Pagura, C. / Facchin, B. / Kristof, J.

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SIMS characterization of noble metal-based thin film electrodes

Piccirillo, C. / Daolio, S. / Gelosi, S. / Pagura, C. / Facchin, B. / Kristof, J.

SIMS characterization of noble metal-based thin film electrodes

Piccirillo, C. / Daolio, S. / Gelosi, S. / Pagura, C. / Facchin, B. / Kristof, J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SIMS characterization of noble metal-based thin film electrodes

Contributors:

Piccirillo, C. (author) / Daolio, S. (author) / Gelosi, S. (author) / Pagura, C. (author) / Facchin, B. (author) / Kristof, J. (author)

Published in:

MATERIALS SCIENCE FORUM ; 625-630

Publication date:

1997-01-01

Size:

6 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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