Diffusivity and surface transition rate of positrons in crystalline silicon as a function of dopant concentration: Fid-Bau Portal

Diffusivity and surface transition rate of positrons in crystalline silicon as a function of dopant concentration

Bauer-Kugelmann, W. / Duffy, J. A. / Stoermer, J. / Koegel, G. / Triftshaeuser, W.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Diffusivity and surface transition rate of positrons in crystalline silicon as a function of dopant concentration

Bauer-Kugelmann, W. / Duffy, J. A. / Stoermer, J. / Koegel, G. / Triftshaeuser, W.

Diffusivity and surface transition rate of positrons in crystalline silicon as a function of dopant concentration

Bauer-Kugelmann, W. / Duffy, J. A. / Stoermer, J. / Koegel, G. / Triftshaeuser, W.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Diffusivity and surface transition rate of positrons in crystalline silicon as a function of dopant concentration

Contributors:

Bauer-Kugelmann, W. (author) / Duffy, J. A. (author) / Stoermer, J. (author) / Koegel, G. (author) / Triftshaeuser, W. (author)

Published in:

APPLIED SURFACE SCIENCE ; 116 ; 231-235

Publication date:

1997-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Zhou, Zibo / Perez-Wurfl, Ivan / Simonds, Brian J. | British Library Online Contents | 2018

Effects of crystalline regrowth on dopant profiles in preamorphized silicon

Hopstaken, M. J. P. / Tamminga, Y. / Verheijen, M. A. et al. | British Library Online Contents | 2004

Electric Field Assisted Reemission of Positrons from Silicon Carbide

Weber, M. H. / Fischer, C. G. / Sato, K. et al. | British Library Online Contents | 2004

Diffusion of Positrons to Surface in Semiconductors

Jiang, J. / Zhou, X. Z. / Zhu, J. et al. | British Library Online Contents | 1995

Surface dopant concentration measurement using the Surface Charge Profiler (SCP) method: characterization of hydrogen and metallic contamination in silicon

Danel, A. / Tardif, F. / Kamarinos, G. | British Library Online Contents | 1999